Equipped with All-New Mx™ Software

Supports ISO 25178 surface measurement parameters

SureScan™ FDA™ technology for advanced measurement capabilities

0.08 nm vertical resolution across all objective lenses

High-speed measurement (32–171 µm/s) for stable data acquisition

Automatic large-area fine surface measurement using Auto Stitching

Inspection of LCD and display components

Surface inspection of MEMS devices and precision surfaces

Roughness analysis of aspheric lenses and various molds

Roughness measurement and dust inspection for glass or wafers

Measurement of fine surface profiles and roughness

Roughness measurement for wafer backside packaging and laser marking

Texture and electrode (finger) analysis of solar cells

Roughness and angle measurement of backlight units

RGB height measurement of color filters

Measurement of automobile components and materials