| Features | 0.08 nm vertical resolution across all objective lenses Automatic large-area fine surface measurement using Auto Stitching Supports ISO 25178 surface measurement parameters SureScan™ FDA™ technology for advanced measurement capabilities Equipped with All-New Mx™ Software High-speed measurement (32–171 µm/s) for stable data acquisition |
| Applications | Inspection of LCD and display components Texture and electrode (finger) analysis of solar cells Surface inspection of MEMS devices and precision surfaces Roughness measurement for wafer backside packaging and laser marking Measurement of fine surface profiles and roughness Roughness analysis of aspheric lenses and various molds RGB height measurement of color filters Measurement of automobile components and materials Roughness and angle measurement of backlight units Roughness measurement and dust inspection for glass or wafers |
| Telephone | +82-31-477-3785 |
| homepage | http://wizoptics.com/zygo?wcode=01&seq=9 |
